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Toshiba deploys Keithley IC test system

Posted: 15 Sep 2003  Print Version  Bookmark and Share Subscribe

Keywords: toshiba  keithley  rf parametric test system  rf ic 

[Summary of tips] Toshiba Corp. has selected Keithley Instruments Inc.'s S630DC/RF parametric test system to support production of its new generation of semiconductors.According to Tatsuo Noguchi, senior manager of Toshiba Corp. Semiconductor Co., the S630 system will be instrumental in enabling the company to reduce its cost of test for its nex......
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