Global Sources
EE Times-Asia
Advanced Search
News
Products
Technical Articles
App Notes
ForumBlogsWhite PapersDatasheetsWebinars
 Catch the latest   Vital Signs     Tech Watch     In Asia
EE Times-Asia > T&M
 
 
T&M  

Eliminating the problems of dual physical verification

Posted: 02 May 2003  Print Version  Bookmark and Share Subscribe

Keywords: physical verification  interactive  batch  dual verification  drc 

[Summary of tips] A single verification tool that can perform fast interactive verification on cells and blocks, as well as fast and accurate batch verification on full-chip SoCs, is essential to meet today's time-to-market schedules.View the PDF document for more information.
 

votes:   Add to Favorites
Direct impedance method for load res...
DBIST answers advanced SoC test chal...
Article Comments - Eliminating the problems of dual phy...
Comments:  
*  You can enter [0] more charecters.
*Verify code:
 
Top Ranked Articles
High-quality Articles
Christmas Wishlist
    Kindle Fire Hot CE innovations at the CES

    All I want for Christmas is any of this year's Best of Innovations Design and Engineering Award honorees! Here's the EE Times pick for Top 10 CE gadgets.

Search EE Times Asia
Peek at Hot Gadgets for 2012
Smart energy "Try explaining to your eight-year-old son that instead of an Xbox, you got him a Wi-Fi enabled smart energy thermostat to help minimize his energy consumption and carbon footprint..."
 

Go to top