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Stanford advanced nano facility to house FEI systems

Posted: 20 Dec 2002  Print Version  Bookmark and Share Subscribe

Keywords: nanocharacterization  strata db 235 small stage dualbeam  fei XL30 sirion scanning electron microscope  3d metrology  device editing 

[Summary of tips] Stanford University has established an advanced nanocharacterization facility in collaboration with FEI Co. The partnership is part of the University's Advanced Materials Initiative to create a set of shared research facilities that will provide top quality instrumentation to faculty in a variety of disciplines.Stanford has pur......
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