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Agilent testers have 40 percent higher throughput

Posted: 17 Dec 2002  Print Version  Bookmark and Share Subscribe

Keywords: Agilent technologies  4070 series  4072b  4073b  semiconductor test equipment 

[Summary of tips] Agilent Technologies Inc. has announced the availability of the 4072B and 4073B parametric test systems that offer 40 percent faster throughput, enabling semiconductor manufacturers to reduce test time for capacitance and dc measurements in wafer manufacturing processes.The new members of the 4070 series feature an integrated h......
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