Global Sources
EE Times-Asia
 Challenges & Opportunities 2011     HDTV     PCIe     HDMI     sensor     WiMAX     FPGA
EE Times-Asia > Amplifiers/Converters
 
 
Amplifiers/Converters  

Anam memory wafers to be tested on Agilent system

Posted: 23 Oct 2002  Print Version  Bookmark and Share Subscribe

Keywords: semiconductor parametric test system  flash memory wafers  digital cameras  pda  memory devices 

[Summary of tips] Anam Semiconductor has selected Agilent Technologies Inc.'s 4072A Semiconductor Parametric Test System for its Flash memory wafers used in digital cameras, PDAs, and other memory devices. According to Anam, its decision was based on the 4072A's stable throughput and capabilities in Flash memory test.The Agilent 4072A is used fo......
Please login or register with us to view this article>>
 

Article Comments - Anam memory wafers to be tested on A...
Comments:  
*  You can enter [0] more charecters.
*Verify code:
 
Christmas Wishlist
Peek at Hot Gadgets for 2012
Smart energy "Try explaining to your eight-year-old son that instead of an Xbox, you got him a Wi-Fi enabled smart energy thermostat to help minimize his energy consumption and carbon footprint..."
 

Go to top