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Applications of atomic force microscopy for contact lens manufacturing

Posted: 25 Mar 2002  Print Version  Bookmark and Share Subscribe

Keywords: microscopy  afm  contact lens  imaging  phase 

[Summary of tips] This application note points out the areas where AFM can provide new capabilities for surface characterizations, as well as to speed product development efforts and improve product quality, performance and yields.View the PDF document for more information.
 

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