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Reducing fault-coverage analysis with DFT, Part 2

Posted: 01 Apr 2002  Print Version  Bookmark and Share Subscribe

Keywords: fpga  ram  fpga  asic  fault coverage 

[Summary of tips] This technical paper is the second of a two-part discussion wherein the author considers fault-coverage analysis and simulation for full-scan testing of ASIC designs.View the PDF document for more information.
 

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