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Sumitomo contact probe features <2mm length, 305m2 area

Posted: 30 Jan 2002  Print Version  Bookmark and Share Subscribe

Keywords: sumitomo electrical industries  sumitomo  sei  contact probe  ic tester 

[Summary of tips] Using its proprietary x-ray lithographic micromachining technology, the company has developed a contact probe that occupies an area of 305m2 and is <2mm long. The company claims that x-ray lithography also allows thicker microstructures, sharper edges, and improved accuracy. The contact probe is designed to test next-generat......
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