Global Sources
EE Times-Asia
Advanced Search
News
Products
Technical Articles
App Notes
ForumBlogsWhite PapersDatasheetsWebinars
 Challenges & Opportunities 2011     MCU     MEMS     IGBT     processor     LED     RFID
EE Times-Asia > EDA/IP
 
 
EDA/IP  

Applying Hubble technology to chip defects

Posted: 01 Dec 2000  Print Version  Bookmark and Share Subscribe

Keywords: nir  infrared  ccd  fpa  mercad telluride 

[Summary of tips] This technical article describes the application of the Hubble space telescope technology to detect chip defects.View the PDF document for more information.
 

votes:   Add to Favorites
The advantage of using logic BIST fo...
SoCs likely to pose heading-off test...
Article Comments - Applying Hubble technology to chip d...
Comments:  
*  You can enter [0] more charecters.
*Verify code:
 
Top Ranked Articles
High-quality Articles
Christmas Wishlist
    Kindle Fire Hot CE innovations at the CES

    All I want for Christmas is any of this year's Best of Innovations Design and Engineering Award honorees! Here's the EE Times pick for Top 10 CE gadgets.

Search EE Times Asia
Peek at Hot Gadgets for 2012
Smart energy "Try explaining to your eight-year-old son that instead of an Xbox, you got him a Wi-Fi enabled smart energy thermostat to help minimize his energy consumption and carbon footprint..."
 

Go to top