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Finding manufacturing process defects with ATPG

Posted: 01 Nov 1999  Print Version  Bookmark and Share Subscribe

Keywords: atpg  automatic test pattern generation  manufacturing  process defects  asic 

[Summary of tips] Rising chip complexity has increased the probability of manufacturing process defects, which inevitably compromises process yield. Automatic Test pattern Generation will help you identify these defects, with the added advantage that it is technology independent.View the PDF document for more information.
 

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