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| 2012-02-10 | Understanding dynamic BTS/UE signals with wireless link analysis Here's an application note that tackles link operation, wireless link analysis, a graphical approach to WLA, and dynamic measurements. |
| 2012-02-09 | Agilent Medalist i1000D with JET board handler Agilent Medalist i1000D with JET board handler |
| 2012-02-08 | Debugging MIL-STD 1553 serial buses with InfiniiVision 3000 X-Series Read about the MIL-STD 1553 triggering and decoding, as well as eye-diagram mask test capabilities in Agilent's InfiniiVision 3000 X-Series oscilloscopes. |
| 2012-02-07 | Oscilloscope training kit for EE students Read about Agilent's education training kit to help EE students learn how to use an oscilloscope more effectively. |
| 2012-02-06 | Ease ARINC 429 bus debugging Read about Agilent's InfiniiVision 3000 X-Series oscilloscopes that provide ARINC 429 triggering and decoding, as well as eye-diagram mask test capability to help you debug your ARINC 429 buses faster. |
| 2012-01-27 | Avoid damaging power meters and sensors Find out how to protect and prolong the life span power meters and power sensors. |
| 2012-01-26 | Learn about stereomicroscopy Read about the demonstration of qualitative stereo imaging on Agilent 8500 compact field emission scanning electron microscope. |
| 2012-01-24 | How to make wideband measurements Learn how to use Agilent PXA signal analyzer as a microwave down converter for an Infiniium oscilloscope or Acqiris digitizer running the 89600 VSA software. |
| 2012-01-23 | Verifying, locating interference Read about the process and techniques for measuring and locating wireless interference using a handheld, portable spectrum analyzer. |
| 2012-01-13 | Guide to using M9392A PXI vector signal analyzer Learn how to best employ the Agilent M9392A PXI microwave vector signal analyzer with 100 MHz streaming capability, including a radar measurement example. |
| 2012-01-12 | Products for ASK/FSK wireless device testing Read Agilent N9310A RF signal generator and Agilent N9320B RF spectrum analyzer, and their use in ASK/FSK wireless device test set ups. |
| 2012-01-11 | How to use N9320B RF spectrum analyzer Read about a test system that can be used to ensure that wireless computer devices meet the defined standards. |
| 2012-01-10 | What is oscilloscope jitter spec Oscilloscope's jitter specifications will not only ensure you select the right oscilloscope, but also enable more accurate measurements and faster time-to-market. |
| 2012-01-09 | Effects of offset, dynamic range and compression on measurements Know how signal offsets and oscilloscope/probe amplifier offsets interact with respect to the dynamic range of the probe amplifiers. |
| 2011-12-30 | Perform FlexRay physical layer eye-diagram mask test Here are the step-by-step instructions on how to set up eye-diagram mask tests on an Agilent InfiniiVision series oscilloscope. |
| 2011-12-29 | PCIe validation and compliance testing Here is an application note intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products. |
| 2011-12-28 | Distortion measurements with performance spectrum analyzer Learn how to perform distortion measurements using the Agilent Technologies performance spectrum analyzer series (model E4440A). |
| 2011-12-27 | Tips for measuring noise figure Find out how to minimize the uncertainties in your noise figure measurements. |
| 2011-12-26 | How to measure noise and noise-like digital comms signals Read about the characteristics of noise and its direct measurement. |
| 2011-10-10 | Choosing the right scope (Part 3) Select a scope that has enough acquisition memory to capture your most complex signals with high resolution. |
| 2011-09-30 | Data capture sol'ns boast high bandwidth Agilent rolls out what it claims as the industry's highest bandwidth PXI data-streaming capability enabling continuous data capture of signals up to 100MHz bandwidth. |
| 2011-09-29 | Agilent discusses Asia business, modular instruments Agilent discusses Asia business, modular instruments |
| 2011-10-07 | Choosing the right scope (Part 2) Select a scope that has a maximum specified sample rate fast enough to deliver the scope's specified real-time bandwidth. |
| 2011-10-06 | Selecting the right switch for test and measurement system Here's a document to assist you in selecting the most appropriate switch type for a given application. |
| 2011-10-05 | Performing wideband digital pre-distortion Learn about a broadband modeling approach that quickly characterizes broadband RF power amplifiers. |
| 2011-10-04 | Boundary scan test debug Read the about the characteristics of a good boundary scan test setup. |
| 2011-10-03 | Choosing the right scope (Part 1) Here's a tip for selecting the scope best suited for certain applications. |
| 2011-08-15 | Agilent logic analyzer touted as industry's fastest Agilent logic analyzer touted as industry's fastest |
| 2011-08-11 | Dynamic current and conductivity measurement using ResiScope Read about a tool for charactering electric properties of a wide range of materials, including metals, semiconductors, devices, and thin films, etc. |
| 2011-08-10 | Testing handovers between LTE and 3G cdma2000/1xEV-DO cellular networks Learn about systems that can be used to provide a more complex RF environment for testing. |
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