Design Test: [T&M/Application Notes][Page 7] News, Tech Articles, App Notes

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Application Notes (Sorted By Date)

FreRes - program for frequency response measurements (2002-10-28)
Rohde & Schwarz device drivers under VEE - installation and troubleshooting (2002-10-28)
Epoxy die attachment for GaAs flip-chip devices (2002-10-24)
A differential VCO design for GSM handset applications (2002-10-24)
6-bit 63dB RF digital attenuator solution (2002-10-24)

A 5GHz - 6GHz switch using low-cost plastic packaged pin diodes (2002-10-24)
Using the PAC-Designer Software Development Kit (2002-10-12)
Switches and attenuators metal package mounting (2002-10-09)
AP112-79 GSM test kit (2002-10-09)
AP119-89 GSM test kit (2002-10-09)

Using MATLAB for remote control and data capture with R&S spectrum and network analyzers (2002-10-05)
GSM/EDGE Base Station Bit Error Rate Testing with CMU300 (2002-10-05)
Conversion Gain Measurements on Mixers with Different Input and Output Impedances (2002-09-26)
Program for Measurement Uncertainty analysis with Rohde & Schwarz Power Meters (2002-09-25)
Measurement of adjacent channel leakage power on 3GPP W-CDMA signals with the FSP (2002-09-06)

Design and use of a DTV monitoring system consisting of DVQ(M), DVMD/DVRM and DVRG (2002-09-05)
TAB tape carrier with micro plating bumps for burn-in testing socket (2002-06-20)
Punching technique of TAB tape carrier for matrix via hole pattern (2002-06-20)
CL10K NoFault testing (2002-06-12)
Silicon micromachining design and fabrication (2002-05-14)

Reflectometer measurements revisited (2002-05-13)
MAN/WAN: Using the MultiFlow 5000 with MAN/WAN carrier services (2002-05-10)
Broadband test system Model 9650: Frame relay protocol analysis (2002-05-09)
What is your measurement accuracy? (2002-05-02)
AutoCal automatic calibrator (2002-05-02)

Intermodulation Distortion (IMD) measurements using the 37300 series vector network analyzer (2002-05-02)
Noise figure corrections (2002-05-02)
Frequency translating group delay (2002-05-02)
Three and four port S-parameter measurements (2002-05-02)
54100A series network analyzers: Precision return loss measurements (2002-05-02)

Amplifier testing with the 37300A VNA (2002-05-02)
360B/37XXXA/B series vector network analyzers (2002-05-02)
Embedding/de-embedding: Simulated removal & insertion of fixtures, matching and other networks (2002-05-02)
Connecting to MT2xx0 test system to Pentium-based boards (2002-03-26)
Microprocessor board troubleshooting techniques using processor emulation (2002-03-26)

Connecting the MT2xx0 to PowerPC boards (2002-03-26)
Ion source applications: Polymer surface modification (2002-03-18)
Ion source precleaning (2002-03-18)
Soil water content measurements: Considering variability and uncertainty (2002-03-08)
How many soil water content measurements are enough? (2002-03-08)

Shaft encoders for water resources applications (2002-03-08)
Basic Stamp I application note: Using PWM for analog output (2002-03-08)
Basic Stamp I application notes: Controlling and testing servos (2002-03-08)
Basic Stamp I application notes: Using a thermistor (2002-03-08)
Lineage2000 ECS 6U and 12U controllers (2002-03-01)

One micron defect detection (2002-03-01)
OXFW900 Application Notes (2002-03-01)
Millimeter wave vector analysis calibration and measurement (2002-03-01)
Design for testability: Using emulation-based ATE (2002-02-25)
Depth profiling of materials and coatings by laser ablation ICP-MS (2001-10-11)

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