Application Notes (Sorted By Date)
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Testing Teccor semiconductor devices using curve tracers
(2001-06-14)
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Assembly and soldering recommendations
(2001-06-14)
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Mounting and handling of semiconductor devices
(2001-06-12)
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Lead-free soldering for the attachment of µBGA packages
(2001-06-07)
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Computer aided testing with MMICAD (Series #3: Using MMICAD to control programmable power supplies & other control devices)
(2001-06-01)
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Computer aided testing with MMICAD (Series #1: Setup and configuration)
(2001-06-01)
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Moisture effects on the soldering of plastic encapsulated devices
(2001-05-29)
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A software algorithm for implementing automatic power ranging
(2001-05-25)
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Testing to ensure your P-NNI implementations is ready to plug-and-play
(2001-05-25)
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A flexible waveform generator using OmniSys and instrumentation
(2001-05-25)
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Accurate and efficient c-v measurements
(2001-05-25)
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Accurate characterization of source Spectra using an optical spectrum analyzer
(2001-05-25)
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ASIC I/O test considerations
(2001-05-25)
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Quality and reliability
(2001-05-25)
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New packages for pressure mounting
(2001-05-25)
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High-density design with MicroStar BGAs
(2001-05-11)
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Measuring deterministic jitter with a K28.5 pattern and an oscilloscope
(2001-04-24)
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Jitter specifications made easy: A heuristic discussion of Fibre Channel and Gigabit Ethernet methods
(2001-04-24)
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Circuit models for plastic packaged microwave diodes
(2001-04-19)
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Test fixtures for high-speed logic
(2001-04-06)
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Testing and specifying FAST logic
(2001-04-06)
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Evaluating the SA605 SO and SSOP demoboard
(2001-04-05)
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On semiconductor logic date code and traceability marking
(2000-12-12)
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High voltage, high current, non-destructive FBSOA testing
(2000-12-11)
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Measurement of Zener voltage to thermal equilibrium with pulsed test current
(2000-12-11)
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Storage and handling of Drypacked surface mounted devices (SMD)
(2000-12-11)
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Nanosecond pulse handling techniques in IC interconnections
(2000-12-08)
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Mounting guidelines for the SUPER-247
(2000-12-01)
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PowIRtab mounting guidelines
(2000-12-01)
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Mounting guidelines for the SUPER-220
(2000-12-01)
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Oscilloscope probing of PC133/Rambus circuits
(2000-11-27)
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Designing boards with Atmel AT89C51, AT89C52, AT89C1051 and AT89C2051 for writing Flash at in-circuit test
(2000-08-31)
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Faster erase times for XC95216 and XC95108 devices on HP 3070 series testers
(2000-06-29)
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XC9500 in-system programming using an embedded microcontroller
(2000-06-28)
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Using serial vector format files to program XC9500 devices in-system on automatic test equipment and third party tools
(2000-06-28)
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A Study of Device Input Impedance in PSpice
(2000-06-15)
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Plastic Packaging and the Effects of Surface-Mount Soldering Techniques
(2000-06-06)
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Implementing Ohmmeter/Temperature Sensor
(2000-05-10)
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International Rectifier's Total Dose Radiation Hardness Assurance (RHA) Test Program
(2000-05-08)
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ESD Testing of MOS Gated Power Transistors
(2000-05-08)
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The do's and don'ts of using MOS-Gated transistors
(2000-05-04)
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Mounting guidelines for the SUPER-220
(2000-05-04)
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Measuring crosstalk in LVDS systems
(2000-04-08)
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Controlled impedance design and test
(2000-03-31)
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Non-contact test access for Surface Mount Technology IEEE 1149.1-1990
(2000-03-25)
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Computing multidimensional DFTs using Xilinx FPGAs
(2000-03-23)
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CSP die shrink solution for memory devices
(2000-03-10)
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Logic Analyzers
(1999-12-17)
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Plastic Ball Grid Array (PBGA)
(1999-12-15)
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Implementing an in-service, non-intrusive measurement device in telecommunication networks using the TMS320C31
(1999-12-11)
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