Design Test: [Design Test/Application Notes][Page 5] News, Tech Articles, App Notes

Global sources

Electronic Engineering Times

Home |

Login | Register Now

[ Jul 26, 2008 ]

New Products | News & Trends | Tech Archives | App Notes | Interview | eeResearch | eeForum

| Latest In Print | Webinar

EDA/IC Design | Process/Manufacturing | Test/Packaging | Sensor Technology | Amplifying/Converting/Conditioning | RF/Wireless

Digital Signal Processing | Control Design | Networking Design | Interface Design | Buffer/Storage | Power Design

EMI/EMC Design | Optical Electronics and Display | Embedded Systems | Programmable Logic | Security Design | Design Test


Design Test	Home / Design Test

This tech room contains material on test methodologies as well as practical tips for checking designs of electronics devices. Articles in this area include EMI test, in-circuit test, RF test, PCB test systems and optical inspection systems.

Application Notes (Sorted By Date)
•	FIREBERD 6000 ATM testing (2001-09-13)
•	ATM end-to-end QoS testing using DominoATM (2001-09-13)
•	Always on/dynamic ISDN (AO/DI) turn-up and maintenance (2001-09-10)
•	Dynamic track definition and measurement (2001-09-10)
•	Making a specific MetroPro version the default (2001-09-04)

•	Subtraction of transmission sphere reference data (2001-09-04)
•	Finite conjugate lens testing (2001-09-03)
•	PV versus RMS (2001-09-03)
•	RMS multipliers for Seidel coefficients (2001-09-03)
•	Generating 7- and 13-bucket ramps (2001-09-03)

•	Pentaprism testing (2001-09-03)
•	Fringe analysis versus phase measuring interferometry (2001-09-03)
•	Interferogram scale factor (2001-09-03)
•	MetroPro cylinder tools (2001-09-03)
•	Testing cylindrical surfaces with computer-generated holograms (2001-09-03)

•	ABS geometry and MetroPro calculations (2001-09-03)
•	Testing cylindrical optics (2001-09-03)
•	Pulse measurements in the picosecond domain (2001-08-31)
•	Eye diagrams of PSPL coaxial components (2001-08-31)
•	Low-pass risetime filters for time domain applications (2001-08-31)

•	Comparison of Ultra-Fast risetime sampling oscilloscopes (Update to include new 50GHz scopes) (2001-08-31)
•	Ultra-wideband differential measurements using PSPL BALUNs (2001-08-31)
•	10ps risetime transmission and TDR measurements using the PSPL 4015B 15ps pulse generator and HP 54124A 50GHz oscilloscope (2001-08-31)
•	Picosecond pulse generators for UWB radars (2001-08-31)
•	Fresnel insertion loss measurement (2001-08-29)

•	Rayleigh insertion loss measurement (2001-08-29)
•	Distance and length measurement (2001-08-29)
•	Fiber amplifier related measurements (2001-08-29)
•	Return loss measurements (2001-08-29)
•	Rayleigh backscatter fiber calibration (2001-08-29)

•	Time of flight measurements (2001-08-29)
•	Return loss measurements of -14dB connectors (2001-08-29)
•	Thyristor/Diode measurement with a multimeter (2001-08-21)
•	The synergy of Chariot and protocol analyzers (2001-06-18)
•	Using Chariot for switch and router performance testing (2001-06-18)

•	Computer aided testing with MMICAD (Series #1: Setup and configuration) (2001-06-01)
•	Computer aided testing with MMICAD (Series #3: Using MMICAD to control programmable power supplies & other control devices) (2001-06-01)
•	Accurate characterization of source Spectra using an optical spectrum analyzer (2001-05-25)
•	A flexible waveform generator using OmniSys and instrumentation (2001-05-25)
•	Testing to ensure your P-NNI implementations is ready to plug-and-play (2001-05-25)

•	A software algorithm for implementing automatic power ranging (2001-05-25)
•	Jitter specifications made easy: A heuristic discussion of Fibre Channel and Gigabit Ethernet methods (2001-04-24)
•	Measuring deterministic jitter with a K28.5 pattern and an oscilloscope (2001-04-24)
•	Designing boards with Atmel AT89C51, AT89C52, AT89C1051 and AT89C2051 for writing Flash at in-circuit test (2000-08-31)
•	Implementing Ohmmeter/Temperature Sensor (2000-05-10)

•	ESD Testing of MOS Gated Power Transistors (2000-05-08)
•	The do's and don'ts of using MOS-Gated transistors (2000-05-04)
•	Measuring crosstalk in LVDS systems (2000-04-08)
•	Controlled impedance design and test (2000-03-31)
•	Non-contact test access for Surface Mount Technology IEEE 1149.1-1990 (2000-03-25)

263 Records, Total 6 Page, The 5 Page
Article review
1 • 2 • 3 • 4 • 5 • 6

Highly Recommended Articles

•	XPLA3 I/O cell characteristics (2008-07-24)
•	Using a Xilinx CoolRunner-II CPLD as a data stream switch (2008-07-24)
•	MSP430x5xx quick start guide (2008-07-09)
•	CX74017: On the direct conversion receiver (2008-07-03)
•	MSP430x5xx overview comparison to MSP430x2xx and MSP430x4xx (2008-07-09)

Talkback

eeForum:
Demystifying Vietnam
What does Vietnam offer that a rising number of top-tier semiconductor companies are setting up and expanding operations there?

Top tech resources

1.Web server design using soft processor(1,287views)

2. Address challenges in DVB-H (1,254views)

3. Using GMR sensors with scan interface (974views)

4. Simple glass breakage detector (970views)

5. Serial flash boot loader (883views)

India Newsletter

1.Board design becomes a nimble giant

2.ECAD-MCAD needs unified solution

3.Smart optical nets power enterprise

4.Fibre-optic networking

Top Ranked Articles

•	Is it all gloom for ATE?
•	Predicting real-world wireless performance
•	Wireless test systems integrate wider signal capabilities
•	NI expands test data management, visualization
•	NI aims dual GbE interface at PXI Express
•	Test highlights Bluetooth issues
•	Study: Automotive industry lacks drive to innovate
•	Mobile WiMAX faces future setbacks
•	Handheld spectrum analyzers feature live RF
•	HDMI verification tool is OVM-ready
	More Top Ranked Articles

Most Recent Tech Articles

•

Partition multicores for embedded networking

•

Save battery life with ambient light sensors

•

Boost battery performance with active charge-balancing

•

Avoid compliance test failure

•

Features define multimedia handsets

•

Implement H-bridges to power automotive SoCs

•

Integrate SMPS control in LED applications

•

Employ fencing for best EMI protection

•

Silicon tuners take on terrestrial TV

•

Boost TV performance with 2D LED dimming

•

A guide to basic audio measurements

•

Ensure HDMI interoperability of consumer electronics

~

eMedia Asia	EE Times - India \| \| \| \| IIC-China
Global Sources	\| \| Electronic Components \| Computer Products \| Trade Show Center \| China Sourcing Fairs
TechInsights	EE Times \| ESM Online

RSS Feed

| Site Feedback | Site Map | Help | About Us | Contact Us | Terms of Use | Privacy Policy | Security Commitment