Design Test: [Design Test/Application Notes][Page 6] News, Tech Articles, App Notes

Market Watch

National, Solmetric co-develop PV software tool
National Semiconductor Corp. has partnered with Solmetric Corp. to develop a software tool to estimate the energy production of solar arrays, including installations outfitted with National's SolarMagic power optimizers.

Application Notes (Sorted By Date)

Testing cylindrical optics (2001-09-03)
MetroPro cylinder tools (2001-09-03)
Pentaprism testing (2001-09-03)
Generating 7- and 13-bucket ramps (2001-09-03)
Fringe analysis versus phase measuring interferometry (2001-09-03)

Interferogram scale factor (2001-09-03)
RMS multipliers for Seidel coefficients (2001-09-03)
PV versus RMS (2001-09-03)
Finite conjugate lens testing (2001-09-03)
10ps risetime transmission and TDR measurements using the PSPL 4015B 15ps pulse generator and HP 54124A 50GHz oscilloscope (2001-08-31)

Picosecond pulse generators for UWB radars (2001-08-31)
Ultra-wideband differential measurements using PSPL BALUNs (2001-08-31)
Eye diagrams of PSPL coaxial components (2001-08-31)
Comparison of Ultra-Fast risetime sampling oscilloscopes (Update to include new 50GHz scopes) (2001-08-31)
Low-pass risetime filters for time domain applications (2001-08-31)

Pulse measurements in the picosecond domain (2001-08-31)
Return loss measurements of -14dB connectors (2001-08-29)
Return loss measurements (2001-08-29)
Fiber amplifier related measurements (2001-08-29)
Rayleigh backscatter fiber calibration (2001-08-29)

Time of flight measurements (2001-08-29)
Distance and length measurement (2001-08-29)
Rayleigh insertion loss measurement (2001-08-29)
Fresnel insertion loss measurement (2001-08-29)
Thyristor/Diode measurement with a multimeter (2001-08-21)

Using Chariot for switch and router performance testing (2001-06-18)
The synergy of Chariot and protocol analyzers (2001-06-18)
Computer aided testing with MMICAD (Series #3: Using MMICAD to control programmable power supplies & other control devices) (2001-06-01)
Computer aided testing with MMICAD (Series #1: Setup and configuration) (2001-06-01)
A software algorithm for implementing automatic power ranging (2001-05-25)

Testing to ensure your P-NNI implementations is ready to plug-and-play (2001-05-25)
A flexible waveform generator using OmniSys and instrumentation (2001-05-25)
Accurate characterization of source Spectra using an optical spectrum analyzer (2001-05-25)
Measuring deterministic jitter with a K28.5 pattern and an oscilloscope (2001-04-24)
Jitter specifications made easy: A heuristic discussion of Fibre Channel and Gigabit Ethernet methods (2001-04-24)

Designing boards with Atmel AT89C51, AT89C52, AT89C1051 and AT89C2051 for writing Flash at in-circuit test (2000-08-31)
Implementing Ohmmeter/Temperature Sensor (2000-05-10)
ESD Testing of MOS Gated Power Transistors (2000-05-08)
The do's and don'ts of using MOS-Gated transistors (2000-05-04)
Measuring crosstalk in LVDS systems (2000-04-08)

Controlled impedance design and test (2000-03-31)
Non-contact test access for Surface Mount Technology IEEE 1149.1-1990 (2000-03-25)
Computing multidimensional DFTs using Xilinx FPGAs (2000-03-23)
Logic Analyzers (1999-12-17)
Implementing an in-service, non-intrusive measurement device in telecommunication networks using the TMS320C31 (1999-12-11)

Consistency in RF testing through automation (1999-12-10)
Design tradeoffs when implementing IEEE 1149.1 (1999-12-08)
Digital boat speedometers (1999-12-07)
System testability using standard logic (1999-12-06)
Handling gallium arsenide die (1999-11-24)

305 Records, Total 7 Page, The 6 Page

Article review

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