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Market Watch
New Products (Sorted By Date)
- Mini USB power meter touts wide frequency range (2008-03-24)
- Test solution rolls for DDR2, DDR3 SDRAM (2008-03-19)
- Digital instrument meets need for deeper pattern memory (2008-03-18)
- Tool detects faults in optical submarine cables (2008-03-18)
-
Test platform fully supports W-CMDA A-GPS conformance testing
(2008-03-18)
- Waveform digitizer PCIe card records up to 2Gsamples (2008-03-17)
- Agilent updates firmware for signal source analyzer (2008-03-14)
- Tektronix claims world's fastest probe (2008-03-07)
- Modules measure microamp current for DUT (2008-03-07)
- Evaluation kit revs up low-power design for ISM band (2008-03-06)
- VXI-MXI-Express controller uses cabled PCIe tech (2008-03-06)
- Agilent inputs customer feedback in firmware upgrade (2008-03-06)
- R&S bulks up 3GPP LTE signal generator firmware (2008-03-04)
- Agilent's firmware update handles MATLAB scripts (2008-03-03)
- PXI switchers support Arinc 608 spec for aerospace apps (2008-03-03)
- PXI controllers eye hybrid testing apps (2008-02-29)
- 1GHz scopes claim 'fastest' memory waveform update (2008-02-28)
- Intersil claims 'most' accurate real-time clocks (2008-02-26)
- 8bit PCI digitizer adds DAQ options (2008-02-26)
- Scope tests PCIe Gen2 signals (2008-02-25)
- Mobile spectrum analyzer tests WLAN, WiMAX, W-CDMA (2008-02-21)
- ORL module rolls for optical passive components (2008-02-21)
- Tektronix releases test suite for SATA Gen-2 PHY (2008-02-21)
-
Agilent debuts LTE UE protocol tester
(2008-02-20)
- Functional verification platform is intelligent (2008-02-20)
- Handheld radio test set comes with spectrum analyzer option (2008-02-19)
- New SMU, switches enhance PXI platform for DC apps (2008-02-18)
- Multiband Mobile WiMAX receiver rolls from Agilent (2008-02-15)
- Agilent scopes add serial bus triggering, decoding (2008-02-12)
- Digital repeater EVM reduces design complexity (2008-02-12)
- 8/16-channel DAQ cards aim at PCIe (2008-02-12)
- Compliance test software supports new serial data standards (2008-02-11)
- USB digitizers, DMMs feature plug-and-play operation (2008-02-11)
- Software tools ease 3GPP LTE signal evaluation (2008-02-11)
-
Scope breaks 1Gpt memory barrier
(2008-02-08)
- Module measures high-speed serial bus signals (2008-02-07)
- Parametric probe cards reduce cost of tests at 45nm (2008-02-01)
- 'First' pulse function arbitrary noise generator rolls (2008-01-31)
- DDR BGA probe debuts for scopes, logic analyzers (2008-01-30)
- Synopsys upgrades signal integrity analysis suite (2008-01-29)
- Spectrum analyzers offer low-cost wireless testing (2008-01-29)
- RF software does multiple simulations from single license (2008-01-28)
- Meter shunt resistor enhances electric meter accuracy (2008-01-25)
- Broadband solid-state PIN diode switch has high isolation (2008-01-23)
- Compact LAN oscilloscope claims high benchtop performance (2008-01-23)
- Oscilloscope function steps up system integrity analysis (2008-01-23)
- Agilent automates UMTS cellular mobile stress test (2008-01-21)
- Multiport power meter speeds up testing (2008-01-18)
- JDSU offers structured cabling test products (2008-01-16)
- Keithley updates ACS test software (2008-01-16)
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Top Ranked Articles
- Test solution meets HDMI 1.4 compliance
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- USB oscilloscopes deliver 5GSps sampling rate
- Slot interposers validate DDR3 memory bus
- Optimizing OCP slave memory behavior
- Test suit handles high-volume IP traffic
- Network analyzer suits high-speed digital comm apps
- Mixed-signal oscilloscopes pack 20 channels
- PXI platform handles LTE tests
- Oscilloscopes feature four high-speed analog channels
