Design Test: [T&M/New Products][Page 19] News, Tech Articles, App Notes

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New Products (Sorted By Date)

Agilent unveils integrated tester for HDMI 1.3 (2006-09-28)
IR thermometer eases remote temperature monitoring (2006-09-26)
Tektronix, FS2 develop debug tool for Xilinx FPGAs (2006-09-26)
Radio network analyzers can scan several networks in parallel (2006-09-25)
Power supply software reduces test time (2006-09-22)

Agilent upgrades PCIe validation, compliance tool (2006-09-21)
Agilent intros low-cost portable multimeters, oscilloscopes (2006-09-20)
Azimuth Systems announces Vo-Wi-Fi handset test suite (2006-09-19)
STMicro unveils 8/16Mbit serial Flash in SO8N package (2006-09-15)
Cadence tool seen to hasten hardware assistance adoption (2006-09-14)

RoHS-compliant adapter eases DIP-to-SOIC conversion (2006-09-12)
Spectrum analyzers address explosion of digital RF apps (2006-09-11)
New NI CAN module enhances CompactRIO connectivity (2006-09-08)
'Signoff quality' timing tool rolls for 65/45nm designs (2006-09-07)
New test solutions ease transition to digital broadcasting (2006-09-07)

Protek rolls out low-cost signal generators (2006-09-06)
AWR rolls out system-level RF simulation tools (2006-09-06)
Tektronix offers 'first' limited lifetime warranty for scopes (2006-09-04)
Tools ease adoption of LXI WTB in test systems (2006-08-31)
Accurate temp sensor suits 65nm process tech (2006-08-30)

Tools roll for Wi-Fi consumer net planning (2006-08-29)
NI unrolls 'first' USB-powered DAQ with M Series features (2006-08-29)
Power analyzer delivers needed accuracy, range (2006-08-28)
NI unrolls new RF analyzer, IF digitizers (2006-08-25)
EMI test receiver features FFT-based time domain scan (2006-08-25)

Signal generators test HD radio signals in AM and FM (2006-08-23)
Tektronix expands differential oscilloscope probe line (2006-08-23)
New dice interconnects support up to 100Gbps (2006-08-22)
Microchip MCUs come in ultrasmall DFN packages (2006-08-22)
Online tool eases evaluation of DDS chips (2006-08-21)

Multifunction DAQ devices offer increased accuracy (2006-08-21)
Web interface adds usability to GPS-sync receiver (2006-08-18)
Solution enables high-speed 25μm backside wafer coating (2006-08-18)
DAQ modules, controllers support PXI Express (2006-08-18)
DAQ cards support PCIe x1 (2006-08-16)

Oscilloscope delivers easy time-domain testing (2006-08-16)
LeCroy unveils software for USB protocol analyzer (2006-08-15)
DAQ system promises high speed, flexibility (2006-08-15)
New NI chassis lowers entry cost for PXI systems (2006-08-15)
LitePoint adds DVT functions to IQfact equipment (2006-08-14)

Analysis tool offers 'sanity check' for parasitic networks (2006-08-10)
Complete measurement solution rolls for WiMAX apps (2006-08-10)
Power quality recorder allows advanced compliance testing (2006-08-09)
Compliance test solution rolls for USB 2.0 designs (2006-08-09)
LeCroy unveils protocol analyzer for PCIe (2006-08-08)

Radiant Imaging unveils luminous intensity tester (2006-08-03)
Scope series offers a test platform for high-speed designs (2006-08-02)
New test platform targets wireless networking (2006-08-01)
Sirenza unveils 'first' SOF 26-packaged LDMOS transistor (2006-08-01)
New NI toolkit targets next-gen automotive ECUs (2006-07-31)

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