Test/Packaging: [Test & Packaging/Technical Archives][Page 2] News, Tech Articles, App Notes

Market Watch

Wipro test facility rises in Bangalore
Wipro Technologies has launched Tarang, a product qualification and compliance certification facility, in Bangalore, India. The facility will enhance product quality; reduce time to market besides providing cost benefits. The investment in this facility is expected to be around $8.5 million.

Technical Archives (Sorted By Date)

Test takes new role in yield improvement (2006-05-01)
RF test aids in design of in-vehicle radio (2006-04-17)
Temperature-aware design of mixed-signal chips (2006-04-17)
Power metering made easy (2006-04-03)
New video compression standards work to meet test challenges (2006-04-03)

Creating low-cost solution for memory test (2006-03-16)
LXI faces physical measurement challenges (2006-03-16)
42V systems allow better power management (2006-03-01)
Beating the BGA test blues (2006-03-01)
I/O error monitoring in industrial machine control (2006-03-01)

IC testing pushes zero defects in autos (2006-03-01)
Test error rate with wideband signal generator (2006-02-16)
QIP metric streamlines the process (2006-02-16)
Modular test keeps up with wireless devt (2006-02-01)
Mighty microanalyzers work wonders (2006-02-01)

Test, repair embedded memories for higher yield (2006-01-16)
Virtual instrumentation for user-defined measurement (2006-01-16)
On-chip instrumentation aids OCP debugging (2006-01-02)
Benefits, dangers of using USB for T&M apps (2005-12-16)
Unified methodology enables full-chip test (2005-12-16)

DPOs enable faster troubleshooting (2005-11-01)
Presenting a mobile measuring system for EMF (2005-10-03)
Fast testers now tackle wireless handsets (2005-09-16)
Analysis tools speed up design debug, verification (2005-09-01)
Standard metal enables paradigm shift in ASIC technology (2005-08-16)

Developing software for audio/visual devices (2005-07-01)
Understand essentials in high-speed PCB designs (2005-06-16)
Implementing modular instrumentation (2005-06-01)
Isolated channels improve power measurements (2005-06-01)
Signals predict Serdes jitter behavior (2005-05-16)

WLAN baseband Tx module testing with DAQ cards (2005-05-02)
Timing is right for real-time spectrum analysis (2005-05-02)
Virtual instrumentation for user-defined apps (2005-03-16)
Transaction-based simulation using SystemC/SCV (2005-03-16)
Vector generation for structural testers (2004-12-01)

Ensuring structural integrity in hybrid modules and MCMs (2004-10-01)
Handling a storm of packaging defects (2004-07-01)
Diagnostic test for design validation (2004-04-16)
Power grid analysis on IR drop and electromigration (2004-02-16)
Formal verification for IP soft core (2003-11-17)

Eliminating the problems of dual physical verification (2003-05-02)
DBIST answers advanced SoC test challenges (2003-04-16)
Delivering a full-chip hierarchical circuit simulation (2003-02-03)
Solder paste process control for CSPs and 0201s (2003-01-16)
VRM: Using a virtual sample to diagnose defects (2002-11-18)

Passing the SoC test with flying colors (2002-10-16)
COT design flow validates SoCs (2002-05-01)
Being reasonable with design constraints (2002-02-01)
TDR for characterization and modeling, Part 1 (2001-12-01)
Custom FPGA-based emulators accelerate IC design (2001-11-16)

151 Records, Total 4 Page, The 2 Page

Article review

1 • 2 • 3 • 4

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