Technical Archives (Sorted By Date)
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Meeting ISO requirements for complex electronic test equipment
(2003-07-16)
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Test system simulates and validates ECMs
(2003-05-16)
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Direct impedance method for load resonant measurement
(2003-05-02)
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Get high availability using effective fault management
(2003-04-01)
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Training for the long run
(2003-03-18)
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Automated testing methods open up opportunities
(2003-03-17)
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Simulation engine reduces fab cycle times
(2003-02-17)
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Delivering a full-chip hierarchical circuit simulation
(2003-02-03)
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Solder paste process control for CSPs and 0201s
(2003-01-16)
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Universal serial bus debug tips
(2003-01-16)
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Ethernet-enabled AC detector test system
(2003-01-16)
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Fine-tuning VoB test capabilities
(2002-12-16)
- Open source hardware (2002-12-02)
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The impact of interference on CDMA receiver
(2002-12-02)
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Testing passive components in optical devices
(2002-11-18)
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VRM: Using a virtual sample to diagnose defects
(2002-11-18)
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Oscilloscope simplifies vibration analysis
(2002-11-01)
- Don't sell yourself short (2002-11-01)
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Temperature sensors detect real world conditions
(2002-10-16)
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Passing the SoC test with flying colors
(2002-10-16)
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Analyze GPRS problems using protocol tester
(2002-10-01)
- Scatterometry-based critical dimension and profile metrology (2002-09-16)
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Smart partitioning could be path to integration
(2002-09-16)
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Smart scope allows USB pre-compliance testing
(2002-09-01)
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Verification reuse ensures predictable design
(2002-07-16)
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New testing strategies for 3G basestation installation
(2002-07-01)
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Reducing IC design time with advanced emulation
(2002-06-01)
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Quality verification and validation
(2002-06-01)
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DFT confronts test cost in design run
(2002-04-16)
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Functional verification of 10M-gate SoCs
(2002-03-01)
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Automatic units tracking in compilers
(2002-03-01)
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Verification tool speeds complex IC out the door weeks ahead of schedule
(2002-02-01)
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Co-verification of an RTOS in a SoC
(2002-01-16)
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Importance of signal analysis for board designers
(2002-01-16)
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Deterministic simulation of an ARM core
(2001-12-01)
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A novel SBU dielectric and coating system
(2001-11-01)
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Breaking the CAM bottleneck
(2001-10-16)
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Stationary lubricants prevent connector failures
(2001-10-16)
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Speed up laser diode attachment with epoxy
(2001-09-16)
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Riding the new roller coaters
(2001-09-01)
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Closing the loop on ESD
(2001-08-16)
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Conductive elastomers deliver sockets for GHz CSPs
(2001-08-16)
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Preventing flip-chip solder joint failures
(2001-08-01)
- Understanding one's needs is key to motivation (2001-07-16)
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Implementing ball attach for CSPs
(2001-07-16)
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High-availability systems boost network uptime: Part 2
(2001-07-16)
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Reworking CSPs, µBGAs and flip-chips
(2001-07-16)
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Thermal Performance Of Power MOSFET Packages
(2001-07-03)
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Establishing design trade-offs for DFM
(2001-07-01)
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Dimensioning and tolerancing
(2001-07-01)
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