New Products
- Aeroflex 3920 radio test set adds TEDS option (2013-05-23)
- Protocol analysers for 16G fibre channel, 10/40G ethernet (2013-05-22)
- Geotest-Marvin broadens PXI chassis offering (2013-05-21)
- R&S FSW-K54 optimises EMI performance in design phase (2013-05-15)
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Scanning system touts 5ms response time, speed up to 20kHz (2013-05-14)
- Data logging software adds picoammeter sync feature (2013-05-13)
- R&S RTM series boasts enhanced ease of use features (2013-05-02)
- Rohde & Schwarz outs high-end vector signal generator (2013-04-30)
- USB 3.0/WiFi MSO debuted by USBee.com (2013-04-24)
- PicoScopes add EZ-USB FX3 controller for USB 3.0 (2013-04-23)
- IXYS rolls out 350V SSR in 8-pin SOIC package (2013-04-23)
- Access+ CUH cuts test floor maintenance time (2013-04-22)
- Cable drop compensator eliminates need for sense wires (2013-04-19)
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LG adopts IC validator, compiler from Synopsys (2013-04-18)
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Symtavision touts SymTA/S with Ethernet timing analysis (2013-04-18)
News & Trends
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Lloyd's Register , A*STAR IHPC set up joint lab (2013-05-14)
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SATS market saw modest but hopeful growth in 2012 (2013-05-08)
- GaGe rolls out PCI Express digitizer line (2013-04-23)
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Variability, reliability interplay damaging to SRAM design (2013-04-19)
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Infineon tops 2012 industrial IC vendor share ranking (2013-04-17)
- Lime enlists Interlligent to meet T&M equipment needs (2013-04-05)
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'Liver-on-chip' designed to predict drug toxicity (2013-03-18)
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OSA unveils ODB++ intelligent data format (2013-02-20)
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UMC, Synopsys partner for design verification at 28nm (2013-02-12)
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AndEBench benchmark tool updated, publishes results (2013-01-30)
- Fraunhofer set to unveil sugar cube-sized spectrometer (2013-01-21)
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Molecular motors in development, says Nature journal (2013-01-16)
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Agilent opens repair, calibration lab in Vietnam (2013-01-04)
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Nanotech research advance new quantum computers (2012-12-26)
- Mobile health devices vendors sold 30 million units (2012-12-13)
Technical Archives
- Increase vertical resolution of scopes (Part 2) (2013-05-21)
- Increase vertical resolution of scopes (Part 1) (2013-05-17)
- Identify interference in complex RF environments (2013-05-14)
- High-speed measurements for hybrid vehicles (2013-04-05)
- Boost RF harmonic measurements with PXI digitizer (2013-04-02)
- Developing a fertility monitor (2013-03-11)
- Accelerate tester-based silicon debug (Part 2) (2013-02-15)
- Accelerate tester-based silicon debug (Part 1) (2013-02-08)
- Reduce power estimation time from weeks to hours (2013-01-25)
- Developing a liquid level control/delivery system (2013-01-16)
- Signal chain basics: Audio metering issues (2013-01-08)
- Effects of burn-in on power supply reliability (2013-01-07)
- A primer on LM-80 standard (2012-12-27)
- Testing EPC for precise LTE/4G billing structures (2012-12-21)
- Perform automated communications measurement (2012-12-17)
Application Notes
- Guide to designing a radio (2013-05-03)
- Measure VSWR to quantify transmission line flaws (2013-04-30)
- Perform margining, calibration for fun and profit (2013-04-18)
- When is calibration necessary? (2013-04-16)
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Designing liquid-level measurement system (2013-04-02)
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Energy measurement and security for smart grid (2013-03-27)
- Mapping alloyed magnesium's mechanical properties (2013-02-08)
- Imaging organic, biological materials with SEM (2013-02-06)
- Contrast mechanisms in SEM imaging of graphene (2013-02-04)
- Imaging graphene via scanning electron microscopy (2013-01-30)
- Low voltage scanning electron microscopy films (2013-01-29)
- Characterising low-dielectric-constant films (2013-01-28)
- Program dev't using Command Expert with LabVIEW (2013-01-25)
- Reducing measurement uncertainty (2013-01-23)
- Block diagrams for 10 Gb/s BERT test systems (2013-01-21)
Hot column
Most Popular
Search EE Times Asia
Top Ranked Articles
- Lloyd's Register , A*STAR IHPC set up joint lab
- Scanning system touts 5ms response time, speed up to 20kHz
- SATS market saw modest but hopeful growth in 2012
- Variability, reliability interplay damaging to SRAM design
- LG adopts IC validator, compiler from Synopsys
- Symtavision touts SymTA/S with Ethernet timing analysis
- Infineon tops 2012 industrial IC vendor share ranking
- Designing liquid-level measurement system
- Suite targets automated wafer-level parameter testing
- Energy measurement and security for smart grid
