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Thermal measurement methodology of RF power amps

Posted: 23 Jun 2014  Print Version  Bookmark and Share

Keywords:Freescale  thermal measurement  RF  power amplifiers  temperature 

This document explains the methodology used by Freescale for thermal measurement of high power RF (Radio Frequency) power amplifiers (RFPA). Semiconductor device reliability heavily depends on device operating temperature so the accurate thermal characterisation of these high power devices is crucial in establishing the reliability of the systems that use such devices.

View the PDF document for more information.

Originally published by Freescale Semiconductor at www.freescale.com as "Thermal Measurement Methodology of RF Power Amplifiers".





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