Tektronix upgrades mixed signal oscilloscopes with IBIS-AMI
Tektronix, Inc. has expanded the analysis system features on its its MSO/DPO70000 series of digital and mixed signal oscilloscopes to addresses accurate system characterisation by enabling visibility into on-chip behaviour.
The upgrade includes modelling of on-chip silicon behaviour using IBIS-AMI models and S-parameters to improve correlation between measurement and simulation.
Tektronix Performance Oscilloscopes GM Brian Reich said: "Until recently, this has not been available on real-time oscilloscopes for the latest high-speed serial data specifications such as SuperSpeed USB or PCI Express 3.0. The introduction of IBIS-AMI models enables silicon vendors to model chip behaviour and those models can be now used on Tektronix oscilloscopes instead of the less accurate reference equalisation models."
Support for IBIS-AMI is included as part of the Serial Data Link Analysis Visualizer (SDLA Visualizer) package that provides a solution for de-embedding the effects of cables, fixtures and probes for silicon validation, system verification, backplane characterisation, and embedded system performance. The SDLA Visualizer also supports "what-if" channel analysis through simulating transmitter equalisation and S-parameter scaling, enabling designers to predict system performance without the need for a physical channel model.
A significant advantage to using IBIS-AMI models is correlation with simulation results and confidence that the resulting measurements match system behaviour. "With the addition of IBIS-AMI support, oscilloscopes are now able to go well beyond simple waveform acquisition to provide a better representation of silicon behaviour for significant time and cost savings," said Brian Burdick, IC Analog Validation Engineer of LSI Corporation.
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