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Tektronix upgrades mixed signal oscilloscopes with IBIS-AMI

Posted: 17 Apr 2014  Print Version  Bookmark and Share

Keywords:Tektronix  oscilloscope  on-chip silicon behaviour 

Tektronix, Inc. has expanded the analysis system features on its its MSO/DPO70000 series of digital and mixed signal oscilloscopes to addresses accurate system characterisation by enabling visibility into on-chip behaviour.

The upgrade includes modelling of on-chip silicon behaviour using IBIS-AMI models and S-parameters to improve correlation between measurement and simulation.

Tektronix Performance Oscilloscopes GM Brian Reich said: "Until recently, this has not been available on real-time oscilloscopes for the latest high-speed serial data specifications such as SuperSpeed USB or PCI Express 3.0. The introduction of IBIS-AMI models enables silicon vendors to model chip behaviour and those models can be now used on Tektronix oscilloscopes instead of the less accurate reference equalisation models."

Tektronix oscilloscope

Support for IBIS-AMI is included as part of the Serial Data Link Analysis Visualizer (SDLA Visualizer) package that provides a solution for de-embedding the effects of cables, fixtures and probes for silicon validation, system verification, backplane characterisation, and embedded system performance. The SDLA Visualizer also supports "what-if" channel analysis through simulating transmitter equalisation and S-parameter scaling, enabling designers to predict system performance without the need for a physical channel model.

A significant advantage to using IBIS-AMI models is correlation with simulation results and confidence that the resulting measurements match system behaviour. "With the addition of IBIS-AMI support, oscilloscopes are now able to go well beyond simple waveform acquisition to provide a better representation of silicon behaviour for significant time and cost savings," said Brian Burdick, IC Analog Validation Engineer of LSI Corporation.





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