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Graphene oxide and its apps revealed by AFM

Posted: 28 Dec 2012  Print Version  Bookmark and Share

Keywords:graphene oxide  atomic force microscopy  Synthesis 

The successful preparation and verification of a mechanically exfoliated graphene monolayer by Novoselov et al. in 2004 has generated huge sensation and fuelled the exponential growth of research on graphene-related materials.1 Recently, graphene oxide (GO) has attracted tremendous attention, owing to the escalating demands for seeking scaled-up production of graphene and exploring their potential applications in various technological fields. Different from graphene that is a single-layer sheet composed purely by carbon atoms with a hexagonal lattice structure, the individual GO sheet is enriched with oxygen-containing groups such as epoxide (a cyclic ether with three ring atoms), hydroxyl (-OH) or carboxylic acid (-COOH) groups, and is highly soluble in water. As a consequence, a proposed three-step approach, i.e.; 1) Synthesis of graphite oxide from pristine graphite power; 2) Exfoliation of graphite oxide in water to generate a dispersion of single-layer graphene oxide; and followed by 3) A chemical or thermal reduction of graphene oxide to graphene; opens up a promising route to achieve large-scale production of graphene. On the other hand, these reactive terminal functionalities can serve as the initial binding sites to direct well-controlled surface interactions, thus to achieve either a designed functionalisation of graphene oxide or constructions of hierarchically structured graphene materials.

In this application note, abovementioned interfacial chemistry as both an intrinsic nature of GO materials and a key driving force for directing their applications will be characterized and illustrated from a microscopic point of view, using atomic force microscopy (AFM) as the main technique.

View the PDF document for more information.

Originally published by Agilent Technologies at www.agilent.com as "Graphene Oxide and Its Applications Revealed by Atomic Force Microscopy".





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