EE Times-Asia

For Registered Users

Rethinking DFT strategies in nanometer designs
Author:Chee-Chun Tay

As the industry races to the 90nm and 65nm nodes, manufacturers are exploring more advanced tests, a 'complete' solution with the most advanced test patterns and fault models needed to improve defect detection.

Please login to view article>>

Email address:
Password:		Password is case-sensitive.
	Remember password Forgot your password?

	If you have already registered on the following websites, please log in using your email address and password
EE Times-Asia sites: EE Times-India EE Times-Taiwan EE Times-Korea EE Times-China Analog/Mix signal Cellphone Power Systems Media Player Embedded Design India Power Design India Home Entertainment Industrial Controls Auto Electronics

If you have already registered on the following websites, please log in using your email address and password

EE Times-Asia sites:

	Latest News
Embedded JTAG ACE Player (2008-09-05) 1:7 Deserialization in Spartan-3E/3A FPGAs at speeds up to 666 Mbps (2008-09-05) CPLD timing (2008-09-05) Wind River field diagnostics (2008-09-05) Wind River General Purpose Platform, VxWorks Edition 3.6 (2008-09-05) Wind River platform for automotive devices, VxWorks Edition 3.6 (2008-09-05) Wind River platform for consumer devices, VxWorks Edition 3.6 (2008-09-05) Wind River platform for industrial devices, VxWorks Edition 3.6 (2008-09-05)

Talkback

eeForum:
Demystifying Vietnam
What does Vietnam offer that a rising number of top-tier semiconductor companies are setting up and expanding operations there?

Top tech resources

1.Web server design using soft processor(1,287views)

2. Address challenges in DVB-H (1,254views)

3. Using GMR sensors with scan interface (974views)

4. Simple glass breakage detector (970views)

5. Serial flash boot loader (883views)

India Newsletter

1.Board design becomes a nimble giant

2.ECAD-MCAD needs unified solution

3.Smart optical nets power enterprise

4.Fibre-optic networking

Go to top

eMedia Asia	EE Times - India\|\|\|
Global Sources	\|\|\|Electronic Components\|Computer Products\|Trade Show Center\|China Sourcing Fairs
TechInsights	EE Times\|ESM Online

Copyright © 2008 eMedia Asia Ltd. All rights reserved. Reproduction in whole or in part in any form or medium without the express written permission of eMedia Asia Ltd.
is prohibited. Warning: The images on this site are protected by digital watermark technology. Your use of this website is subject to, and constitutes acknowledgement
and acceptance of our Terms of Use.