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[ Jul 21, 2008 ]

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VNAs address RF measurement challenges

Accurate characterization of high-frequency components linear and nonlinear performance, along with the trend toward greater subsystem integration, is changing the way RF and microwave devices are being tested. This article discusses how vector network analyzers are adapting. It also discusses advances in VNA calibration, which ensure that the accuracy associated with two-port S-parameter measurements is maintained.

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