EE Times-Asia

For Registered Users

Open architecture ATE tackles test woes
Author:Rochit Rajsuman

The basic idea behind the open architecture test system is to provide such modularization with specific focus on the use of third-party modules and test instruments.

Please login to view article>>

Email address:
Password:		Password is case-sensitive.
	Remember password Forgot your password?

	If you have already registered on the following websites, please log in using your email address and password
EE Times-Asia sites: EE Times-India EE Times-Taiwan EE Times-Korea EE Times-China Analog/Mix signal Power Systems Embedded Design India Power Design India Home Entertainment Handheld Device Industrial Controls Auto Electronics

If you have already registered on the following websites, please log in using your email address and password

EE Times-Asia sites:

	Latest News
Synopsys heralds 2-3x speed boost with IC Compiler release (2008-10-06) Intoto software fit for SME security market (2008-10-06) Mobile WiMAX SoC responds to base stations' needs (2008-10-06) TI to send out software video codec for free (2008-10-06) WiMAX emulator allows real-world network testing (2008-10-06) IAR Embedded Workbench 5.20 suits ARM Cortex-M3 (2008-10-06) 500mA step-down converter promises faster transient response (2008-10-06) Low-power DC/DCs come in compact package (2008-10-06)

Talkback

eeForum:
Demystifying Vietnam
What does Vietnam offer that a rising number of top-tier semiconductor companies are setting up and expanding operations there?

Top tech resources

1.Web server design using soft processor(1,287views)

2. Address challenges in DVB-H (1,254views)

3. Using GMR sensors with scan interface (974views)

4. Simple glass breakage detector (970views)

5. Serial flash boot loader (883views)

India Newsletter

1.Board design becomes a nimble giant

2.ECAD-MCAD needs unified solution

3.Smart optical nets power enterprise

4.Fibre-optic networking

Go to top

eMedia Asia	EE Times - India\|\|\|
Global Sources	\|\|\|Electronic Components\|Computer Products\|Trade Show Center\|China Sourcing Fairs
TechInsights	EE Times\|ESM Online

Copyright © 2008 eMedia Asia Ltd. All rights reserved. Reproduction in whole or in part in any form or medium without the express written permission of eMedia Asia Ltd.
is prohibited. Warning: The images on this site are protected by digital watermark technology. Your use of this website is subject to, and constitutes acknowledgement
and acceptance of our Terms of Use.