EE Times-Asia

For Registered Users

Low open area (2 percent) oxide-etch endpoint using the CETAC EP-2000

This application note discusses the use of the CETAC EP-2000 Endpoint and Plasma Diagnostic System to solve the sensitivity issues for low open area plasma etch endpoint applications.

Please login to view article>>

Email address:
Password:		Password is case-sensitive.
	Remember password Forgot your password?

	If you have already registered on the following websites, please log in using your email address and password
EE Times-Asia sites: EE Times-India EE Times-Taiwan EE Times-Korea EE Times-China Analog/Mix signal Power Systems Embedded Design India Power Design India Home Entertainment Handheld Device Industrial Controls Auto Electronics

If you have already registered on the following websites, please log in using your email address and password

EE Times-Asia sites:

	Latest News
RMS detector touts excellent accuracy, linearity (2008-10-07) Downconverting SiGe mixer suits up for wireless tasks (2008-10-07) Free-space optics to replace RF links in orbital apps (2008-10-07) Compact ARM9 MCUs integrate high speed USB OTG (2008-10-07) Advanced AFEs ease use for portable ultrasound systems (2008-10-07) Synchronization controller cuts costs in mobile networks (2008-10-07) AxisNT begins volume production of WiMAX RRHs (2008-10-07) Computer-on-module supports Intel Core2 Duo processor (2008-10-07)

Talkback

eeForum:
Demystifying Vietnam
What does Vietnam offer that a rising number of top-tier semiconductor companies are setting up and expanding operations there?

Top tech resources

1.Web server design using soft processor(1,287views)

2. Address challenges in DVB-H (1,254views)

3. Using GMR sensors with scan interface (974views)

4. Simple glass breakage detector (970views)

5. Serial flash boot loader (883views)

India Newsletter

1.Board design becomes a nimble giant

2.ECAD-MCAD needs unified solution

3.Smart optical nets power enterprise

4.Fibre-optic networking

Go to top

eMedia Asia	EE Times - India\|\|\|
Global Sources	\|\|\|Electronic Components\|Computer Products\|Trade Show Center\|China Sourcing Fairs
TechInsights	EE Times\|ESM Online

Copyright © 2008 eMedia Asia Ltd. All rights reserved. Reproduction in whole or in part in any form or medium without the express written permission of eMedia Asia Ltd.
is prohibited. Warning: The images on this site are protected by digital watermark technology. Your use of this website is subject to, and constitutes acknowledgement
and acceptance of our Terms of Use.