For Registered Users Home / For Registered Users

Frost-free environment for the thermal testing of high performance MCMs with RF circuitry


This application note describes a frost-free enclosure, with plug-and-play ATE interface, for the thermal testing of high-performance multichip module (MCM) with RF circuitry.

Please login to view article>>

Email address:
Password: Password is case-sensitive.
Remember password Forgot your password?
 
If you have already registered on the following websites, please log in using your email address and password

EE Times-Asia sites:

Latest News
Talkback

eeForum:
Demystifying Vietnam

What does Vietnam offer that a rising number of top-tier semiconductor companies are setting up and expanding operations there?

more

 
Top tech resources
 
Go to top