Design for testability (DFT) and built-in self-test (BIST) techniques are widely publicized in SoC (Systems-on-Chip) designs, but are still often only thought of as "back end" concerns. In reality, the importance of these techniques insures the highest fault coverage and shortest production test time in the device design cycle.
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eeForum: Demystifying Vietnam What does Vietnam offer that a rising number of top-tier semiconductor companies are setting up and expanding operations there?
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