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Using the Microchip Endurance Predictive Software
Author:Peter Sorrells, Richard J. Fisher and David Wilkie

This application note discusses the endurance, which refers to the number of times an individual memory cell can be erased and written, of nonvolatile EEPROM devices. In this discussion, the term "ENDURANCE" will be used to describe the collective endurance of all memory cells in the EEPROM device.

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